Parker
Research
Corporation
 
Magnetic Particle
Testing Instruments
and Accessories
 
CONTOUR PROBE®
 
800 525 3935
sales@ParkerNDT.com
 


DA-400 Series Contour Probes

 

Click to enlarge and view kits

  • Versatility and powerful performance in a lightweight (8 lbs.) instrument
  • Constant AC or pulsed DC fields with the flip of a switch
    for the location of surface and some sub-surface defects
  • Apply continuous or residual magnetic fields and demagnetize too
  • Use with dry powder, wet fluorescent or visible
  • High impact molded housing
  • One year repair/replacement guarantee
  • Optional Y-400 Yoke Light where shown is available at additional cost


The DA-400 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferro-magnetic materials.

The selective AC and pulsed DC functions are built into a single reliable instrument. The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense pulsed DC field for detection of some subsurface defects.

Controls and solid-state electronics are contained within the high impact molded housing. Articulating legs allow the AC or DC field to be applied to the precise area of inspection on nearly any part of the surface shape... in the lab, factory or field site.

All Parker Contour Probes comply with the requirements of applicable specifications. Certified for European CE requirements.

DA-400 kit specifications
 

 

 Parker Research Corporation • 2642 Enterprise Rd. W., Clearwater FL 33763 • 800 525 3935 • 727 796 4066 • Fax 727 797 3941

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